Gallery is a monitoring, browsing and analyzing system of defect image and data detected by an inspection system. Able to build up “System not to make failure product” by utilizing defect analyzing mode.

• Defect images and data can be printed out.
• It’s possible to browse and manage multiple inspection systems through 1 Gallery by networking.
• It’s possible to browse and manage multiple systems.
• We have many functions such as blinking a master and a defect image, profiling function with a graphical display and defect mapping to visualize location defect occurred as a defect image browsing and analyzing function.
• By filtering search function, it’s possible to extract arbitrary defect image and data.